Recent Advances in Logo Detection Using Machine Learning Paradigms
Yen-Wei Chen, Xiang Ruan, Rahul Kumar Jain
Various logo recognition methods have been proposed, most of which require huge annotated datasets for training, posing significant challenges due to domain discrepancies between training and testing datasets. These discrepancies often result in sub-optimum detection accuracy. This book aims to document recent advancements and explore future directions for deep learning in logo recognition. The book also provides valuable insights into feature learning and the application of various deep learning frameworks in logo recognition through detailed experiments and analyses, offering readers a comprehensive understanding of deep learning and logo detection.
Categorías:
Año:
2024
Editorial:
Springer
Idioma:
english
Páginas:
119
ISBN 10:
3031598113
ISBN 13:
9783031598111
Serie:
Intelligent Systems Reference Library
Archivo:
PDF, 4.93 MB
IPFS:
,
english, 2024